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PRS as
MIX-Møhlenpris PB 24
5006 Bergen
+47 5532 5221
+47 5558 9496

Courses based on Xtricator

PRS offer curses - both standard and special adapted

Regular Standard courses

PRS invite you to attend courses in multicomponent analysis. The courses are given by experts in the specific fields and you gain valuable insight at these courses. PRS offers both open courses and in-house courses. The majority of the courses are given in Norwegian or English. Courses can be provided on short notice throughout Europe and North America. Courses in the rest of the world might be possible. In addition we offer workshops and seminars

Each course is explained in more detail by following the links below.

Please observe that we have only listed the courses that we have already established as regularly events. We will offer several other courses, and we put them on our web pages a few months before they are arranged. Therefore we invite you to check our web-site regularly.

Courses based on use of Xtricator

*Multicomponent analysis

Multicomponent analysis
Course code: MultiComp

The aim of this course is to learn chromatographers and spectroscopists how chemometric methods can resolve and extract hidden information in profiles from multidetection instruments.

Background needed: None.

Hands-on examples included in this course are resolution of multicomponent data from liquid chromatography with diode array detection, and, infrared profiles recorded on chemical reactions.
The course starts with an overview of taxonomy of multicomponent problems, and proceed with a thorough discussion of the resolution of so-called "black systems", i.e. mixtures with an unknown number of chemical components, unknown identity of components and unknown quantity of the components. Then a range of procedures and techniques are introduced to resolve overlapping multicomponent profiles into their contributing components. The procedures include detection and correction for background and baseline, detection of noise structure, determination of a multivariate decision limit, and, moving window techniques and latent-projective graphs for determination of local rank. The resolution techniques are evolving factor analysis, heuristic evolving latent projections, orthogonal projections and sequential rank analysis
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